RAIN Xplorer Inline tester
CISC Semiconductor

RAIN Xplorer Inline tester

CISC testing solution for Production and Quality Verification

Ensuring high-quality RAIN RFID tags in high volumes is one of the key requirements for tag manufacturers as well as end-users. Performance testing of the tags on multiple test points can be done at high speed with CISC RAIN Xplorer inline tester either in production process or offline with reel2reel tester.

RAIN Xplorer Inline tester for production process

The CISC RAIN Xplorer Inline is a unit for high speed performance testing of RAIN inlays and tags during production process. It offers quality assurance during the production process start to end. It comes with an GUI that allows the user a detailed overview of the performance metrics.

DI Josef Preishuber-Pflügl

Being active in UHF RFID and NFC since its beginning it is great to see how the technology evolved and became mature. CISC is now offering product and services to support a very high maturity level of both RFID and NFC through measurement+test products, as well as with product development support services to allow even more growth for RFID+NFC.

DI Josef Preishuber-Pflügl
CTO and Business Manager RFID+NFC
Klagenfurt, Austria

Product Category


Application Fields

Sales Region

Key features

  • 800 MHz to 1 GHz
  • TX power range from
  • 1 dBm to 28 dBm
  • Sensitivity -80 dBm
  • Read EPC, TID and memory
  • Write memory (encoding)
  • Measure tag sensitivity over frequency
  • GPIO for triggering external HW
  • USB for user interface


  • CISC RAIN Inline Xplorer helps spot anomalies during the production process in real time.
  • It offers the user the flexibility to create your own performance matrix for better analysis there by saving time and cost.
  • Testing for performance on multiple frequencies on a single RAIN RFID inlay or tags at high speed to match the current market demand.
  • Improves overall quality management of the product.

CISC is an international oriented and highly awarded company that provides competitive and innovative products and technology for design and verification of heterogeneous networked embedded microelectronic systems.

  • Global leader in providing RFID and NFC test solutions
  • Solutions for all passive UHF RFID standards including RAIN RFID, GS1 EPCglobal, ISO/IEC 18000-63 Type C UHF RFID Air interface, and ISO/IEC 29167 Crypto Suites
  • Our NFC test devices meet the requirement of EMVco, NFC-Forum, ISO/IEC, Apple Pay, Android Pay, Samsung Pay, and other contactless payment schemes
  • Experience in the semiconductor, automotive, wireless communication, and RFID industry
Solution News

Harmonized UHF Frequency Bands From 2020 in the EU?

No new published harmonized standard yet - How to proceed now! At the beginning of 2020, the final document of the harmonized EU standard EN 302 208 should make the use of the upper UHF frequency band possible throughout Europe. This is a result of the ETSI meeting in Sophia-Antipolis on 15 October 2019. Josef Preishuber-Pflügl, Vice-Chairman of ERM TG34 RFID at ETSI since 2005, gave a keynote speech on 30 October 2019 at the RFID & Wireless IoT tomorrow where he presented the latest information from the standardization process. "On the part of ETSI, the standardization work has been completed. The ball is now in the court of the EU Commission and the member states to implement the use quickly," says Preishuber-Pflügl. For this reason AIM Europe invites to a webinar on 13 November 2019 to inform all interested parties from the RFID industry about the latest developments. Article compiled by RFID & Wireless IoT global with information from Josef Preishuber-Pflügl, Vice-Chairman ERM TG34 RFID, ETSI, presented at RFID & Wireless IoT tomorrow 2019.

Product News

CISC Extends Xplorer Portfolio

CISC Extends Xplorer Portfolio to Ensure RAIN Inlay, Reader and Tag Performance on a High Quality New RAIN RFID testing solutions to save time and cost by enabling quality assurance during high-speed production process as well as flexibility to create own performance metrics for analyzing market demands. CISC Semiconductors GmbH announced the launch of an extended Xplorer portfolio supporting a high-speed reader, inlay and tag performance. The Xplorer portfolio consists of a RAIN Xplorer Inline tester, a RAIN Xplorer reel2reel tester, and an Impedance Emulator feature for RFID Xplorer to reduce cost, development effort and time-to-market for customers in the RAIN RFID market.

RAIN Xplorer reel2reel tester
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